"Reflectometry Measurement with Free-Form Lighting"
Kaori Kikuchi, Bruce Lamond, Abhijeet Ghosh, Pieter Peers, Paul Debevec, Ichikari Ryosuke, and Hideyuki Tamura

Pattern Recognition and Media Understanding, January 2011
This paper introduces a prototype system for measurement of per-pixel appearance parameters. For example, diffuse albedo, specular albedo, surface normals and specular roughness. Some conventional techniques estimate BRDF from images under constructed illuminations. On the other hand, images are captured with a free-form hand-held light from a fixed viewpoint camera in our system. We employ a simple method using images which have only diffuse component for estimating light directions. Polarizer and image-based methods are used for separation of diffuse and specular components in general scenes. Additionally, image-based relighting is required for free-form light conditions to calculate reflectance properties of objects.

Related Publications
  • Kaori Kikuchi, Bruce Lamond, Abhijeet Ghosh, Pieter Peers, and Paul Debevec, "Free-Form Polarized Spherical Illumination Reflectometry", ACM SIGGRAPH ASIA 2010 Sketches, Seoul, Republic of Korea, December 2010,
author = {Kikuchi, Kaori and Lamond, Bruce and Ghosh, Abhijeet and Peers, Pieter and Debevec, Paul and Ryosuke, Ichikari and Tamura, Hideyuki},
title = {Reflectometry Measurement with Free-Form Lighting},
month = {January},
year = {2011},
booktitle = {Pattern Recognition and Media Understanding},