"Fabricating Microgeometry for Custom Surface Reflectance"
Tim Weyrich, Pieter Peers, Wojciech Matusik, and Szymon Rusinkiewicz

ACM Transactions on Graphics, Volume 28, Issue 3, Article 32, July 2009
Abstract
We present a novel image-based method for separating diffuse and specular reflections of real objects under distant environmental illumination. By illuminating a scene with only four high frequency illumination patterns, the specular and diffuse reflections can be separated by computing the maximum and minimum observed pixel values. Furthermore, we show that our method can be extended to separate the diffuse and specular component under image-based environmental illumination. Applications range from image-based modeling of reflectance properties to improved normal and geometry acquisition.


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Bibtex
@article{Weyrich:2009:FMC,
author = {Weyrich, Tim and Peers, Pieter and Matusik, Wojciech and Rusinkiewicz, Szymon},
title = {Fabricating Microgeometry for Custom Surface Reflectance},
month = {July},
year = {2009},
articleno = {32},
journal = {ACM Transactions on Graphics},
volume = {28},
number = {3},
doi = {http://doi.acm.org/10.1145/1531326.1531338},
}
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