"Free-form Polarized Spherical Illumination Reflectometry"
ACM SIGGRAPH ASIA 2010 Sketches, December 2010
Abstract
We present a prototype system for in-situ measurement of per-pixel appearance parameters (i.e., surface orientation, diffuse albedo, specular albedo, and specular roughness) of general scenes. The proposed system requires no specialized hardware, is light weight, and requires no on-site calibration. This makes our system particularly well suited for capturing the appearance of real-world scenes under uncontrolled conditions.
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ACM SIGGRAPH ASIA 2010 Sketches, December 2010
AbstractWe present a prototype system for in-situ measurement of per-pixel appearance parameters (i.e., surface orientation, diffuse albedo, specular albedo, and specular roughness) of general scenes. The proposed system requires no specialized hardware, is light weight, and requires no on-site calibration. This makes our system particularly well suited for capturing the appearance of real-world scenes under uncontrolled conditions.
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@misc{Kikuchi:2010:FPS,
author = {Kikuchi, Kaori and Lamond, Bruce and Ghosh, Abhijeet and Peers, Pieter and Debevec, Paul},
title = {Free-form Polarized Spherical Illumination Reflectometry},
month = {December},
year = {2010},
howpublished = {ACM SIGGRAPH ASIA 2010 Sketches},
doi = {http://doi.acm.org/10.1145/1899950.1899971},
}
author = {Kikuchi, Kaori and Lamond, Bruce and Ghosh, Abhijeet and Peers, Pieter and Debevec, Paul},
title = {Free-form Polarized Spherical Illumination Reflectometry},
month = {December},
year = {2010},
howpublished = {ACM SIGGRAPH ASIA 2010 Sketches},
doi = {http://doi.acm.org/10.1145/1899950.1899971},
}